Investigation of epitaxial Nd1.85Ce0.15CuO4 − y film surface by low energy electron diffractometry

被引：0
|
作者：
M. B. Tsetlin
A. A. Zakharov
A. P. Menushenkov
A. A. Ivanov
M. N. Mikheeva
I. Lindau
机构：
[1] Russian Research Centre “Kurchatov Institute,
[2] ”,undefined
[3] MAX-lab,undefined
[4] Lund University,undefined
[5] Moscow Engineering Physics Institute (State University),undefined
[6] Lund University,undefined
来源：
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques | 2008年 / 2卷
关键词：
Valence Band; Surface Investigation; Neutron Technique; Photoelectron Spectrum; Vacuum Annealing;
D O I：
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中图分类号：
学科分类号：
摘要：
The surface of epitaxial Nd1.85Ce0.15CuO4 − y(001) (NCCO) film has been studied by low energy electron diffractometry (LEED) and photoelectron spectroscopy. Ar+ ion etching of a surface with subsequent annealing in oxygen at atmosphere pressure has been found to lead to the ordered structure restoration of surface layers with the symmetry type and lattice parameters corresponding to the NCCO phase. Annealing in vacuum at temperatures close to the boundary of thermodynamic phase stability results in the formation of epitaxial Ce0.5Nd0.5O1.75 phase on a surface that is indicated in the LEED pattern as additional spots corresponding to the surface lattice (√2 × √2)R45°.
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页码：928 / 930
页数：2
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