Differential low-coherence interferometry for in situ diagnostics of transparent structures

被引：0
|
作者：
V. V. Ivanov
V. A. Markelov
M. A. Novikov
S. S. Ustavshchikov
机构：
[1] Russian Academy of Sciences,Institute for Physics of Microstructures
来源：
Technical Physics Letters | 2004年 / 30卷
关键词：
Microstructure; Extremal Condition; High Noise; Differential Method; Noise Immunity;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
We describe and demonstrate a new differential method capable of measuring the profiles of transparent structures. Based on fiber-optic low-coherence interferometry and possessing a high noise immunity, the proposed technique can be used for the noncontact in situ diagnostics of microstructures under extremal conditions.
引用
收藏
页码：389 / 391
页数：2
相关论文
共 50 条
  • [1] Differential low-coherence interferometry for in situ diagnostics of transparent structures
    Ivanov, VV
    Markelov, VA
    Novikov, MA
    Ustavshchikov, SS
    [J]. TECHNICAL PHYSICS LETTERS, 2004, 30 (05) : 389 - 391
  • [2] Light source for low-coherence interferometry surface diagnostics
    Buchta, Zdenek
    Mikel, Bretislav
    Rerucha, Simon
    Lazar, Josef
    Cip, Ondrej
    [J]. INTERNATIONAL CONFERENCE ON APPLICATIONS OF OPTICS AND PHOTONICS, 2011, 8001
  • [3] Application of low-coherence interferometry for in situ nondestructive evaluation of thin and thick multilayered transparent composites
    Khomenko, Anton
    Cloud, Gary Lee
    Haq, Mahmoodul
    [J]. OPTICAL ENGINEERING, 2015, 54 (12)
  • [4] Low-coherence interferometry with synthesis of coherence function
    Teramura, Y
    Suzuki, K
    Suzuki, M
    Kannari, F
    [J]. APPLIED OPTICS, 1999, 38 (28) : 5974 - 5980
  • [5] Surface diagnostics using low-coherence interferometry and colour single CCD camera
    Buchta, Zdenek
    Mikel, Bretislav
    Lazar, Josef
    Cip, Ondrej
    [J]. 17TH SLOVAK-CZECH-POLISH OPTICAL CONFERENCE ON WAVE AND QUANTUM ASPECTS OF CONTEMPORARY OPTICS, 2010, 7746
  • [6] Sensitivity Enhancement for Low-Coherence Interferometry
    Benitez, J.
    Mora, J.
    [J]. IEEE PHOTONICS TECHNOLOGY LETTERS, 2017, 29 (20) : 1735 - 1738
  • [7] Differential phase measurements in low-coherence interferometry without 2π ambiguity
    Hitzenberger, CK
    Sticker, M
    Leitgeb, R
    Fercher, AF
    [J]. OPTICS LETTERS, 2001, 26 (23) : 1864 - 1866
  • [8] Low-coherence interferometry by intensity correlation
    R. Coisson
    P.V. Hôi
    P. Podini
    B. Huy
    V.D. Thinh
    [J]. Applied Physics B, 2000, 71 : 905 - 907
  • [9] Dynamically enhanced low-coherence interferometry
    Mitsui, Takahisa
    Aoki, Kenichiro
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2018, 89 (09):
  • [10] Low-coherence interferometry by intensity correlation
    Coïsson, R
    Hôi, PV
    Podini, P
    Huy, B
    Thinh, VD
    [J]. APPLIED PHYSICS B-LASERS AND OPTICS, 2000, 71 (06): : 905 - 906
12345