Review of near-field optical microscopy

被引:0
|
作者
Wu S.-F. [1 ]
机构
[1] Institute of Near-field Optics and Nanotechnology, Department of Physics, Dalian University of Technology
来源
Frontiers of Physics in China | 2006年 / 1卷 / 3期
关键词
Atomic force microscope combined with photon scanning tunneling optical microscope (AF/PSTM); Near-field optical microscope (NOM); SNOM;
D O I
10.1007/s11467-006-0027-7
中图分类号
学科分类号
摘要
This review has introduced a new near-field optical microscope (NOM) -atomic force microscope combined with photon scanning tunneling microscope (AF / PSTM). During scanning, AF/PSTM could get two optical images of refractive index image and transmissivity image, and two AFM images of topography image and phase image. A reflected near-field optical microscope (AF/RSNOM) has also been developed on AF/PSTM platform. The NOM has been reviewed in this paper and the comparison between AF/PSTM & RSNOM and the commercial A-SNOM & RNOM has also been discussed. The functions of AF/PSTM & RSNOM are much better than A-SNOM & RNOM. © Higher Education Press and Springer-Verlag 2006.
引用
收藏
页码:263 / 274
页数:11
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