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Enhanced dielectric properties of Bi1.5ZnNb1.5O7 thick films via cold isostatic pressing
被引:0
|作者:
Weihong Liu
Hong Wang
机构:
[1] Xi’an university of posts and telecommunications,School of electronic engineering
[2] Xi’an Jiaotong University,Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education
来源:
关键词:
Bi;
ZnNb;
O;
thick films;
Dielectric properties;
High milling technology;
Cold isostatic pressing;
D O I:
暂无
中图分类号:
学科分类号:
摘要:
Dense Bi1.5ZnNb1.5O7 thick films were prepared on Ag/Al2O3 substrates using screen-printing technology at a lower temperature of 825 °C. A novel pretreatment of cold isostatic pressing was introduced to enhance the quality of thick films. After cold isostatic pressing prior to sintering, the microstructure of thick films was improved with a more compact morphology and better dielectric properties, and the permittivity and dielectric loss of thick films sintered at 900 °C were about 160 and 0.006. The obvious tunability of thick films was also observed, and the tunability value reached about 3 % for thick films sintered at 900 °C under 400 kV/cm. The enhanced properties and low-temperature sintering made this compound a potential candidate for Low Temperature Co-fired Ceramic (LTCC).
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页码:183 / 186
页数:3
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