Sources of Error in Total Reflection X-Ray Fluorescence Analysis and Error Correction Using the Internal Standard Method

被引：0
|
作者：
G. V. Pavlinskii
A. N. Smagunova
O. M. Karpukova
O. Bolormaa
D. Dorzh
机构：
[1] Irkutsk State University,
[2] National University of Mongolia,undefined
来源：
Journal of Analytical Chemistry | 2002年 / 57卷
关键词：
Reflection; Analytical Chemistry; Fluorescence Intensity; Standard Method; Systematic Error;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
An analytical equation is proposed for the fluorescence intensity excited in total reflection X-ray fluorescence analysis. Errors in the results of analysis of solutions of hair samples caused by the mutual influence of elements and by the nonuniformity of the distribution of the material in the emitter are quantitatively estimated. It is shown that these effects are small. They can be efficiently corrected using the internal standard method, provided the difference between wavelengths of the compared lines is small. Otherwise, a decrease in the systematic error is insignificant. Experiments confirmed the theoretical conclusions.
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页码：185 / 193
页数：8
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