Spectral quantum tomography

被引:0
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作者
Jonas Helsen
Francesco Battistel
Barbara M. Terhal
机构
[1] Delft University of Technology,QuTech
[2] JARA Institute for Quantum Information,undefined
[3] Forschungszentrum Juelich,undefined
来源
npj Quantum Information | / 5卷
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摘要
We introduce spectral quantum tomography, a simple method to extract the eigenvalues of a noisy few-qubit gate, represented by a trace-preserving superoperator, in a SPAM-resistant fashion, using low resources in terms of gate sequence length. The eigenvalues provide detailed gate information, supplementary to known gate-quality measures such as the gate fidelity, and can be used as a gate diagnostic tool. We apply our method to one- and two-qubit gates on two different superconducting systems available in the cloud, namely the QuTech Quantum Infinity and the IBM Quantum Experience. We discuss how cross-talk, leakage and non-Markovian errors affect the eigenvalue data.
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