共 50 条
- [23] Impact of Pre-Existing Voids on Electromigration in Copper Interconnects [J]. 2012 19TH IEEE INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS (IPFA), 2012,
- [28] Impact of infection or vaccination on pre-existing serological memory [J]. HUMAN IMMUNOLOGY, 2012, 73 (11) : 1082 - 1086
- [29] A new model for the growth of normal faults developed above pre-existing structures [J]. GEOLOGY, 2021, 49 (09) : E537 - E537