Structural and Optical Characterization of Chemically Deposited PbS Thin Films

被引:0
|
作者
A. N. Fouda
M. Marzook
H. M. Abd El-Khalek
S. Ahmed
E. A. Eid
A. B. El Basaty
机构
[1] Suez Canal University,Physics Department, Faculty of Science
[2] University of Hail,Recruitment Department
[3] Suez University,Basic Science Department, Faculty of Petroleum and Mining Engineering
[4] Higher Technological Institute,Department of Basic Science
[5] Helwan University,Basic Science Department, Faculty of Industrial Education
来源
Silicon | 2017年 / 9卷
关键词
PbS films; Chemical bath deposition; Surface morphology; XRD;
D O I
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中图分类号
学科分类号
摘要
PbS thin films were deposited on glass substrates by a chemical bath deposition method. The effect of varying the film thickness on the structural and optical properties has been investigated. XRD analysis reveals the crystallinity of the deposited PbS films with (200) preferred crystal orientation. Increasing the film thickness enhances the crystallinity of the films as well as decreases the strain and dislocation density. The surface morphology features were dramatically changed from small spherical grains to bead-like shape. The absence of impurities in the deposited films was confirmed by energy dispersive x-ray spectrometry (EDX) measurements. The optical constants of the deposited films were calculated and a small decrease in the band gap energy was observed with increasing the film thickness.
引用
收藏
页码:809 / 816
页数:7
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