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Zn/ZnSe thin films deposition by RF magnetron sputtering

被引：0
|
作者：
H. Hakan Yudar
Suat Pat
Şadan Korkmaz
Soner Özen
Volkan Şenay
机构：
[1] Eskişehir Osmangazi University,Physics Department
[2] Bayburt University,Education Faculty
来源：
Journal of Materials Science: Materials in Electronics | 2017年 / 28卷
关键词：
Root Mean Square; ZnSe; Atomic Force Microscopy Image; Coated Film; Zinc Selenide;
D O I：
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中图分类号：
学科分类号：
摘要：
In this paper, Zn/ZnSe thin films were deposited on glass substrates by RF magnetron sputtering system. XRD analyses were done. Zn and ZnSe phases were obtained. Miller indices of obtained Zn phases were detected in (320), (620) and (112) crystal formation. For the ZnSe phases, only one peak of (110)/(220) was observed. The surface morphology of the samples was investigated by an atomic force microscopy tools. It found that average roughness of the films was increased by raised RF power. The thin films around 80 % of high transmittance were measured. The band gap values were calculated as to be ~2.80 eV by the Cauchy model. The calculated refractive indices values were approximately 2.25 by a relation between the refractive index and the band gap.
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页码：2833 / 2837
页数：4
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