Review paper: Nano-floating gate memory devices

被引:0
|
作者
Jang-Sik Lee
机构
[1] Kookmin University,School of Advanced Materials Engineering
来源
关键词
memory devices; nanoparticles; flash memory; organic transistors; flexible electronics;
D O I
暂无
中图分类号
学科分类号
摘要
In recent decades, memory device technology has advanced through active research and the development of innovative technologies. Single transistor-based flash memory device is one of the most widely used forms of memory devices because their device structure is simple and the scaling is feasible. A nano-floating gate memory (NFGM) device is a kind of flash memory devices that uses nanocrystals as a charge-trapping element. The use of nanocrystals has advantages over memory devices that rely on other methods such as discontinuous trap sites and controllable trap levels. Nowadays considerable progress has been made in the field of NFGM devices, and novel application areas have been explored extensively. This review article focuses on new technologies that are advancing these developments. The discussion highlights recent efforts and research activities regarding the fabrication and characterization of nonvolatile memory devices that use a nanocrystal layer as a charge-trapping element. The review concludes with an analysis of device fabrication strategies and device architectures of NFGM devices for possible application to devices that are organic, printed, and flexible.
引用
收藏
页码:175 / 183
页数:8
相关论文
共 50 条
  • [31] Charging effect of a nano-floating gate capacitor with double-layered Au nano-particles
    Lee, Dong Uk
    Lee, Min Seung
    Lee, Tae Hee
    Kim, Eun Kyu
    Kim, Won Mok
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2008, 53 (03) : 1484 - 1487
  • [32] Fabrication and Characteristics of Nano-Floating Gate Memories with ZnO Nano-Crystals as Charge-Storage Layer
    Liu, Lu
    Su, Yong
    Xu, Jing-Ping
    Zhang, Yi-Xian
    CHINESE PHYSICS LETTERS, 2018, 35 (06)
  • [33] Fabrication and Characteristics of Nano-Floating Gate Memories with ZnO Nano-Crystals as Charge-Storage Layer
    刘璐
    苏勇
    徐静平
    张贻贤
    Chinese Physics Letters, 2018, 35 (06) : 107 - 110
  • [34] Reduced Distribution of Threshold Voltage Shift in Double Layer NiSi2 Nanocrystals for Nano-Floating Gate Memory Applications
    Choi, Sungjin
    Lee, Junhyuk
    Kim, Donghyoun
    Oh, Seulki
    Song, Wangyu
    Choi, Seonjun
    Choi, Eunsuk
    Lee, Seung-Beck
    JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2011, 11 (12) : 10553 - 10556
  • [35] A FLOATING GATE AND ITS APPLICATION TO MEMORY DEVICES
    KAHNG, D
    SZE, SM
    BELL SYSTEM TECHNICAL JOURNAL, 1967, 46 (06): : 1288 - +
  • [36] Reduced Distribution of Threshold Voltage Shift in Double Layer NiSi2 Nanocrystals for Nano-Floating Gate Memory Applications
    Choi, Sung-Jin
    Lee, Jun-Hyuk
    Kim, Dong-Hyoun
    Oh, Seul-ki
    Song, Wangyu
    Choi, Seon-Jun
    Lee, Seung-Beck
    INEC: 2010 3RD INTERNATIONAL NANOELECTRONICS CONFERENCE, VOLS 1 AND 2, 2010, : 1246 - +
  • [37] Nano-floating gate capacitor with SnO2 quantum dots distributed in polyimide dielectrics
    Lee, Dong Uk
    Seo, Ki Bong
    Han, Seung Jong
    Kim, Eun Kyu
    Kim, Young-Ho
    PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 2009, 246 (04): : 893 - 896
  • [38] One step synthesis of Au nanoparticle-cyclized polyacrylonitrile composite films and their use in organic nano-floating gate memory applications
    Cho, Se-Phin
    Jang, Sukjae
    Jo, Hae-Na
    Lee, Sang-A
    Bae, Sukang
    Lee, Sang Hyun
    Hwang, Junyeon
    Joh, Han-Ik
    Wang, Gunuk
    Kim, Tae-Wook
    JOURNAL OF MATERIALS CHEMISTRY C, 2016, 4 (07) : 1511 - 1516
  • [39] Charging effect of In2O3 nano-particles embedded in polyimide layer for application as non-volatile nano-floating gate memory
    Kim, Seon Pil
    Lee, Tae Hee
    Lee, Dong Uk
    Kim, Eun Kyu
    Koo, Hyun-Mo
    Cho, Won-Ju
    Kim, Young-Ho
    CURRENT APPLIED PHYSICS, 2009, 9 : S43 - S46
  • [40] Semiconductor nanocrystal floating-gate memory devices
    Dimitrakis, P
    Normand, P
    MATERIALS AND PROCESSES FOR NONVOLATILE MEMORIES, 2005, 830 : 203 - 216