electron micrographs;
amorphous metal alloys;
fractal dimension;
spectral power density;
frequency characteristic of an electron microscope;
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摘要:
A method of synthesis of fractal nanostructure micrographs most similar to the initial electron micrographs is considered. The method is based on the modified modulus of the Fourier transform of the examined micrographs; moreover, information on the transformation phase is preserved. The nanostructure micrographs so obtained can be filtered out from false structures engendered by some methods of electron-microscopic study.