Effect of the charge state of defects on the light-induced kinetics of the photoconductivity of amorphous hydrated silicon

被引:0
|
作者
O. A. Golikova
机构
[1] Russian Academy of Sciences,A. F. Ioffe Physicotechnical Institute
来源
Semiconductors | 1998年 / 32卷
关键词
Silicon; Hydrated; Magnetic Material; Fermi Level; Charge State;
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学科分类号
摘要
The photoconductivity and defect density in films of nondoped a-Si:H soaked with light (W=114 mW/cm2, λ<0.9 µm) for 5 h were investigated. It is shown that σph ~ t-γ and ND ~ tβ, where γ>β or γ⋍β, depending on the position of the Fermi level prior to light soaking, i.e., depending on the charge state of the defects: D− and D0 or D+ and D0. It is also shown that the light-induced kinetics of σph is affected by a transition of the defects into the D0 state because of a corresponding shift of the Fermi level during light soaking.
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页码:312 / 315
页数:3
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