A Charge Plasma Based Label Free Biomolecule Detector Using SiGe-Heterojunction Double Gate Tunnel FET

被引:0
|
作者
Basudha Dewan
Shalini Chaudhary
Menka Yadav
机构
[1] Malaviya National Institute of Technology Jaipur,Department of Electronics and Communication Engineering
来源
Silicon | 2022年 / 14卷
关键词
Biosensor; Nano-cavity; Sensitivity; Dielectric Modulation (DM); Short Channel Effects (SCEs); Charge plasma (CP);
D O I
暂无
中图分类号
学科分类号
摘要
To overcome the random dopant fluctuations (RDFs) and high thermal budget problems faced by normally doped Tunnel Field Effect Transistor (TFET) devices, charge plasma SiGe-heterojunction double gate TFET is utilized to design a label free biosensor. The performance of proposed biosensor is analyzed for different values of dielectric constant (k), charge density (both positive and negative), gate work function and cavity dimensions. These parameters alter the electric properties of the biosensor which help in the detection process. Their effect on the drain current, electric field, surface potential, sub-threshold swing (SS), ION/IOFF ratio, and electron tunneling rate (ETR) of the device is also discussed. Furthermore, the drain current sensitivity of the proposed biosensor is analyzed and it is found that a maximum sensitivity of 1.13 × 1010 is obtained for dielectric constant k = 12. The proposed biosensor is implemented by carrying out two-dimensional device simulations using the Silvaco ATLAS tool.
引用
收藏
页码:3259 / 3268
页数:9
相关论文
共 42 条
  • [41] Enhanced Biosensing with Double Gate Junctionless FET based on III-V Compound Semiconductor and Symmetric Cavity for Label-Free Detection of Neutral and Charged Biomolecules
    Shaveisi, Maryam
    Vadizadeh, Mahdi
    Fallahnejad, Mohammad
    SENSING AND IMAGING, 2024, 25 (01):
  • [42] Direct label-free protein detection in high ionic strength solution and human plasma using dual-gate nanoribbon-based ion-sensitive field-effect transistor biosensor
    Ma, Shenhui
    Li, Xin
    Lee, Yi-Kuen
    Zhang, Anping
    BIOSENSORS & BIOELECTRONICS, 2018, 117 : 276 - 282