Degradation of CVD-grown MoS2 subjected to DC electrical stress

被引：0
|
作者：
Elisabeth Mansfield
David Goggin
Jason Killgore
Taylor Aubry
机构：
[1] National Institute of Standards and Technology,Applied Chemicals and Materials Division, Materials Measurement Laboratory
[2] National Renewable Energy Laboratory,Chemistry and Nanoscience Center
来源：
MRS Communications | 2022年 / 12卷
关键词：
2D materials; Electronic material; Electrical properties; SEM; Durability;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：878 / 885
页数：7
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