Morphological change during crystallization of thin amorphous solid water films on Ru(0001)

被引：29

作者：

Kondo, Takahiro

Kato, Hiroyuki S.

Bonn, Mischa

Kawai, Maki

机构：

[1] RIKEN, Inst Phys & Chem Res, Surface Chem Lab, Hirosawa, Saitama 3510198, Japan

[2] FOM Inst Atom & Mol Phys, NL-1098 SJ Amsterdam, Netherlands

[3] Univ Tokyo, Dept Adv Mat Sci, Kashiwa, Chiba 2778561, Japan

来源：

JOURNAL OF CHEMICAL PHYSICS | 2007年 / 126卷 / 18期

关键词：

D O I：

10.1063/1.2739504

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The isothermal crystallization process of thin amorphous solid water (ASW) films on Ru(0001) has been investigated in real time by simultaneously employing helium atom scattering, infrared reflection absorption spectroscopy, and isothermal temperature-programmed desorption. The measurements reveal that the crystallization mechanism consists of random nucleation events in the bulk of the ASW films, followed by homogeneous growth. Morphological changes of the solid water film during crystallization expose the water monolayer just above the substrate to the vacuum during the crystallization process. (c) 2007 American Institute of Physics.

引用

页数：5

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