Wang-Landau Monte Carlo simulation of capillary forces at low relative humidity in atomic force microscopy

被引：15

作者：

Harrison, Aaron J. ^{[1
]}

Beaudoin, Stephen P. ^{[1
]}

Corti, David S. ^{[1
]}

机构：

[1] Purdue Univ, Sch Chem Engn, W Lafayette, IN 47907 USA

来源：

JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY | 2016年 / 30卷 / 11期

关键词：

surface thermodynamics; atomic force microscopy; relative humidity; capillary forces; Wang-Landau sampling; PULL-OFF FORCE; ADHESION FORCES; MENISCUS CONDENSATION; SURFACE-ROUGHNESS; KELVIN EQUATION; THIN-FILMS; WATER; TEMPERATURE; PARTICLE; GLASS;

D O I：

10.1080/01694243.2016.1143581

中图分类号：

TQ [化学工业];

学科分类号：

0817 ;

摘要：

A lattice gas model is used with Wang-Landau Monte Carlo sampling to predict the capillary force between a model of an atomic force microscopy (AFM) probe and a smooth surface as a function of separation, relative humidity (RH), and tip hydrophilicity. Completely wetting AFM tips exhibit a maximum in the capillary force as the RH increases, while the magnitude of the capillary force in the presence of partially wetting and partially drying tips is relatively independent of the RH. Capillary forces can also be significant in low RH environments and should not be discounted in AFM studies involving hydrophilic surfaces.

引用

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页码：1165 / 1177

页数：13

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