Flaws detection and characterization using the multi-frequency excitation and spectrogram ECT method

被引：0

作者：

Chady, T ^{[1
]}

Enokizono, M ^{[1
]}

Todaka, T ^{[1
]}

Tsuchida, Y ^{[1
]}

Sikora, R ^{[1
]}

机构：

[1] Oita Ind Res Inst, Oita 87011, Japan

来源：

ELECTROMAGNETIC NONDESTRUCTIVE EVALUATION (IV) | 2000年 / 17卷

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Multi-Frequency Excitation and Spectrogram (MFES) method for eddy current nondestructive testing was developed by the authors in order to improve traditional systems performance. The purpose of this paper is to demonstrate enhanced ability of the MFES method to flaw detection and flaws characterization. Various sensors for testing plates and tubes are proposed. The extended experiments with all the sensors were performed and their results are presented and discussed.

引用

页码：87 / 94

页数：8

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