Frequency scanning technique for nondestructive testing a multi-frequency excitation and spectrogram method

被引:0
|
作者
Enokizono, M [1 ]
Chady, T [1 ]
Todaka, T [1 ]
Tsuchida, Y [1 ]
机构
[1] Oita Univ, Fac Engn, Oita 8701192, Japan
关键词
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中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
The purpose of this paper is to present an idea and demonstrate advantages of the Multi-frequency Excitation Spectrogram Method. The short explanation of the MFES method is given. The extended experiments were conducted and the selected results are presented in order to confirm advantages of the proposed technique. Methods for flaws identification are also proposed.
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页码:2513 / 2518
页数:6
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