Mission profile resolution impacts on the thermal stress and reliability of power devices in PV inverters

被引：16
|
作者：
Sangwongwanich, A. [1 ]
Zhou, D. [1 ]
Liivik, E. [1 ]
Blaabjerg, F. [1 ]
机构：
[1] Aalborg Univ, Dept Energy Technol, DK-9220 Aalborg, Denmark
来源：
MICROELECTRONICS RELIABILITY | 2018年 / 88-90卷
关键词：
Mission profile; Power device; Thermal stress; Solar irradiance; Reliability prediction; Sampling rate; Power electronics; Photovoltaic systems; SYSTEMS;
D O I：
10.1016/j.microrel.2018.06.094
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The operating conditions and reliability of Photovoltaic (PV) inverters are strongly affected by their mission profile. Since the mission profile of the PV system can vary considerably, the time-resolution of the mission profile becomes an important factor in the reliability prediction. In this paper, the impacts of mission profile resolutions on the reliability of the PV inverters are investigated. The results indicate that the mission profile resolution can deviate the reliability prediction considerably, especially during the fluctuating solar irradiance condition, and care must be taken during the reliability assessment.
引用
收藏
页码：1003 / 1007
页数：5
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