Activation energies for deprotection reaction of chemically amplified resists : A study using in-situ FT-IR spectroscopy

被引:8
|
作者
Shinozuka, T [1 ]
Tsunooka, M
Itani, T
Shirai, M
机构
[1] Univ Osaka Prefecture, Grad Sch Engn, Dept Appl Chem, Sakai, Osaka 5998531, Japan
[2] Semicond Leading Edge Technol Inc, Tsukuba, Ibaraki 3058569, Japan
关键词
deprotection reaction; photoresist; activation energy; in-situ FT-IR;
D O I
10.2494/photopolymer.15.765
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
[No abstract available]
引用
收藏
页码:765 / 768
页数:4
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