共 50 条
- [32] X-Ray Diffraction Microscopy [J]. ANNUAL REVIEW OF CONDENSED MATTER PHYSICS, VOL 1, 2010, 1 : 237 - 255
- [35] Investigation of substrate-dependent characteristics of SnO2 thin films with Hall effect, X-ray diffraction, X-ray photoelectron spectroscopy and atomic force microscopy measurements [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1999, 38 (4A): : 2103 - 2107
- [38] X-ray photoelectron spectroscopy and diffraction in the hard X-ray regime: Fundamental considerations and future possibilities [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2005, 547 (01): : 24 - 41