Bivariate sign tests based on the sup, L1 and L2 norms

被引:4
|
作者
Larocque, D
Tardif, S
van Eeden, C
机构
[1] Univ Montreal, Dept Math & Stat, Montreal, PQ H3C 3J7, Canada
[2] Univ British Columbia, Dept Stat, Vancouver, BC V6T 1Z2, Canada
关键词
location problem; distribution-free; affine-invariance; normal process; wiener process; L-1-norm; L-2-norm; Hedges' test; Blumen's test;
D O I
10.1023/A:1004121503274
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
The bivariate location problem is considered. The sup, L-1 and L-2 norms are used to construct bivariate sign tests from the univariate sign statistics computed on the projected observations on all lines passing through the origin. The tests so obtained are affine-invariant and distribution-free under the null hypothesis. The sup-norm gives rise to Hedges' test. A class of tests derived from the L-2-norm, with Blumen's test as a member, is seen to be related to a class proposed by Oja and Nyblom (1989, J. Amer. Statist. Assoc., 84, 249-259). The L-1-norm gives rise to a new test. Its asymptotic null distribution is seen to be the same as that; of the L-1-norm of a certain normal process related to the standard Wiener process. An explicit expression of its cumulative distribution Function is given. A simulation study will examine the merits of the three approaches.
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页码:488 / 506
页数:19
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