Ageing assessment of supercapacitors during calendar life and power cycling tests

被引:0
|
作者
El Brouji, El Hassane [1 ]
Vinassa, Jean-Michel [1 ]
Briat, Olivier [1 ]
Bertrand, Nicolas [1 ]
Deletage, Jean-Yves [1 ]
Woirgard, Eric [1 ]
机构
[1] Univ Bordeaux 1, Lab IMS, F-33405 Talence, France
关键词
ULTRACAPACITORS; SPECTROSCOPY; BEHAVIOR;
D O I
暂无
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Supercapacitors, also known as ultracapacitors, are commonly based on porous activated carbon electrodes and electrostatic charge storage mechanisms. Carbon electrodes are supposed to be chemically and electrochemically inert and the electrostatic nature of the charge storage mechanism is highly reversible. These properties should assure that supercapacitors have an infinite shelf life. But in practice, supercapacitor cells exhibit performances fading when they are used for months. This paper deals with the performances fading of supercapacitors under calendar life and power cycling tests. The used impedance model is analytical and based on physical quantities as double layer capacitance, specific area and electrolyte conductivity but also on elementary electrodes dispersion. A periodic characterization based on impedance spectroscopy is done in order to quantify the impedance changes during ageing tests. The obtained results confirm that impedance real part is increasing and the capacitance is decreasing during the two ageing tests, nevertheless the way they change is different. The impedance real part increase is independent of the frequency in calendar life test while, in power cycling test, this increase is accentuated at low frequencies. This difference will be explained thanks to impedance model parameters evolution. This study confirms that the two ageing tests affect differently the supercapacitor performances.
引用
收藏
页码:1718 / 1725
页数:8
相关论文
共 50 条
  • [1] How supercapacitors reach end of life criteria during calendar life and power cycling tests
    Chaari, R.
    Briat, O.
    Deletage, J. Y.
    Woirgard, E.
    Vinassa, J. -M.
    MICROELECTRONICS RELIABILITY, 2011, 51 (9-11) : 1976 - 1979
  • [2] Contribution of calendar ageing modes in the performances degradation of supercapacitors during power cycling
    Briat, O.
    Vinassa, J. -M.
    Bertrand, N.
    El Brouji, H.
    Deletage, J. -Y.
    Woirgard, E.
    MICROELECTRONICS RELIABILITY, 2010, 50 (9-11) : 1796 - 1803
  • [3] Performances regeneration of supercapacitors during accelerated ageing tests in power cycling
    Chaari, R.
    Briat, O.
    Deletage, J. Y.
    Vinassa, J. -M.
    PROCEEDINGS OF THE 2011-14TH EUROPEAN CONFERENCE ON POWER ELECTRONICS AND APPLICATIONS (EPE 2011), 2011,
  • [4] Comparison between changes of ultracapacitors model parameters during calendar life and power cycling ageing tests
    El Brouji, H.
    Briat, O.
    Vinassa, J. -M.
    Bertrand, N.
    Woirgard, E.
    MICROELECTRONICS RELIABILITY, 2008, 48 (8-9) : 1473 - 1478
  • [5] SUPERCAPACITOR DEGRADATION ASSESMENT BY POWER CYCLING AND CALENDAR LIFE TESTS
    Sedlakova, Vlasta
    Sikula, Josef
    Majzner, Jiri
    Sedlak, Petr
    Kuparowitz, Tomas
    Buergler, Brandon
    Vasina, Petr
    METROLOGY AND MEASUREMENT SYSTEMS, 2016, 23 (03) : 345 - 358
  • [6] Capacitance recovery analysis and modelling of supercapacitors during cycling ageing tests
    Chaari, R.
    Briat, O.
    Vinassa, J. -M.
    ENERGY CONVERSION AND MANAGEMENT, 2014, 82 : 37 - 45
  • [7] Constant power cycling for accelerated ageing of supercapacitors
    Paul, Kreczanik
    Christian, Martin
    Pascal, Venet
    Guy, Clerc
    Gerard, Rojat
    Younes, Zitouni
    EPE: 2009 13TH EUROPEAN CONFERENCE ON POWER ELECTRONICS AND APPLICATIONS, VOLS 1-9, 2009, : 812 - 821
  • [8] Impact of Calendar Life and Cycling Ageing on Supercapacitor Performance
    El Brouji, El Hassane
    Briat, Olivier
    Vinassa, Jean-Michel
    Bertrand, Nicolas
    Woirgard, Eric
    IEEE TRANSACTIONS ON VEHICULAR TECHNOLOGY, 2009, 58 (08) : 3917 - 3929
  • [9] Power cycling tests for accelerated ageing of ultracapacitors
    Briat, O.
    Lajnef, W.
    Vinassa, J-M.
    Woirgard, E.
    MICROELECTRONICS RELIABILITY, 2006, 46 (9-11) : 1445 - 1450
  • [10] Thermal cycling impacts on supercapacitor performances during calendar ageing
    Ayadi, M.
    Briat, O.
    Eddahech, A.
    German, R.
    Coquery, G.
    Vinassa, J. M.
    MICROELECTRONICS RELIABILITY, 2013, 53 (9-11) : 1628 - 1631