SIMULATIONS OF SPACE-CHARGE PHENOMENA IN ION TRAPS AND TOF MASS SPECTROMETERS WITH THE USE OF FMM

被引：0
|
作者：
Sudakov, M. [1 ]
机构：
[1] Ryazan Radioengn Acad, Ryazan 390005, Russia
来源：
RECENT TRENDS IN CHARGED PARTICLE OPTICS AND SURFACE PHYSICS INSTRUMENTATION, PROCEEDINGS | 2008年
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中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
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页码：103 / 104
页数：2
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