Radiation Test Results for Common CubeSat Microcontrollers and Microprocessors

被引：0

作者：

Guertin, Steven M. ^{[1
]}

Amrbar, Mehran ^{[1
]}

Vartanian, Sergeh ^{[1
]}

机构：

[1] CALTECH, Jet Prop Lab, 4800 Oak Grove Dr, Pasadena, CA 91109 USA

来源：

2015 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW) | 2015年

关键词：

D O I：

暂无

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

SEL, SEU, and TID results are presented for microcontrollers and microprocessors of interest for small satellite systems such as the TI MSP430F1611, MSP430F1612 and MSP430FR5739, Microchip PIC24F256GA110 and dsPIC33FJ256GP710, Atmel AT91SAM9G20, and Intel Atom E620T, and the Qualcomm Snapdragon APQ8064.

引用

页码：152 / 160

页数：9

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