Graded AlGaN Channel Transistors for Improved Current and Power Gain Linearity

被引:65
|
作者
Bajaj, Sanyam [1 ]
Yang, Zhichao [1 ]
Akyol, Fatih [1 ]
Park, Pil Sung [2 ]
Zhang, Yuewei [1 ]
Price, Aimee L. [1 ]
Krishnamoorthy, Sriram [1 ]
Meyer, David J. [3 ]
Rajan, Siddharth [1 ]
机构
[1] Ohio State Univ, Dept Elect & Comp Engn, Columbus, OH 43210 USA
[2] Navitas Semicond, El Segundo, CA 90245 USA
[3] Naval Res Lab, Washington, DC 20375 USA
基金
美国国家科学基金会;
关键词
Graded AlGaN; constant f(T); gain linearity; GaN; graded AlGaN; high-electron-mobility transistor (HEMT); polarization-doped field-effect transistor (PolFET); ELECTRON-MOBILITY TRANSISTORS; MOLECULAR-BEAM EPITAXY; OHMIC CONTACTS; HEMTS; F(T);
D O I
10.1109/TED.2017.2713784
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report on the small-signal high frequency characteristics of highly scaled graded AlGaN channel polarization-doped field-effect transistors (PolFETs) that show constant current gain cutoff frequency (f(T)) and maximum oscillation frequency (f(max)) profiles as a function of current density or gate bias. The device design includes upward and downward Al composition grading to induce a distributed 3-D charge profile, and eliminate abrupt heterojunction band offsets to achieve nonalloyedohmic contacts with low resistance. The highest extrinsic f(T) of 52 GHz and fmax of 67 GHz weremeasured at V-GS = -1.5 V andVDS = 9 V, and constant fT and fmax over wide input voltage (VGS) and output current range (IDS) were achieved.
引用
收藏
页码:3114 / 3119
页数:6
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