Random Swapping Dynamic Element Matching Technique for Glitch Energy Minimization in Current-Steering DAC

被引：40
|
作者：
Shen, Meng-Hung [1 ]
Tsai, Jen-Huan [1 ]
Huang, Po-Chiun [1 ]
机构：
[1] Natl Tsing Hua Univ, Dept Elect Engn, Hsinchu 300, Taiwan
来源：
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS | 2010年 / 57卷 / 05期
关键词：
Digital-analog conversion (DAC); dynamic element matching (DEM); glitch; TO-ANALOG CONVERTERS; DELTA-SIGMA;
D O I：
10.1109/TCSII.2010.2043400
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Dynamic element matching (DEM) has been employed to increase the spurious-free dynamic range of data converters. However, generic DEM techniques will induce additional glitch energy. This brief describes a type of the DEM method called random swapping thermometer coding for the implementation of Nyquist-rate current-steering digital-to-analog converters. The selecting direction for a sequence of unit current sources will be randomly changed. Furthermore, combining the restricted jumping technique simultaneously can further smooth low-frequency idle tones. This approach can minimize the number of switched elements as codes change, while achieving good spectrum purity as other DEM implementations. Examples from a behavior-level simulation for 6-bit converters are given to illustrate harmonic suppression and glitch energy improvement achieved by the proposed algorithm.
引用
收藏
页码：369 / 373
页数：5
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