Plasma effects in lateral Schottky junction tunneling transit-time terahertz oscillator

被引:14
|
作者
Ryzhii, V. [1 ]
Satou, A.
Khmyrova, I.
Ryzhii, M.
Otsuji, T.
Mitin, V.
Shur, M. S.
机构
[1] Univ Aizu, Comp Solid State Phys Lab, Aizu Wakamatsu 9658580, Japan
[2] Tohoku Univ, Elect Commun Res Inst, Sendai, Miyagi 9808577, Japan
[3] SUNY Buffalo, Dept Elect Engn, Buffalo, NY 14260 USA
[4] Rensselaer Polytech Inst, Dept Elect Comp & Syst Engn, Troy, NY 12180 USA
关键词
D O I
10.1088/1742-6596/38/1/055
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We study the plasma oscillations in a two-dimensional electron channel with a reverse-biased Schottky junction. Using the developed model we show that the negative dynamic conductivity of the Schottky junction associated with the tunneling injection and electron-transit-time effect can result in the self-excitation of plasma oscillations (plasma instability) in the quasineutral portion of the channel serving as a resonant cavity. The spectrum of plasma oscillations and the conditions of their self-excitations are expressed via the structure parameters. The instability can be used in a novel diode device - lateral Schottky junction tunneling transit-time terahertz oscillator.
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页码:228 / 233
页数:6
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