Microfocusing of hard x-rays with cylindrically bent crystal monochromators

被引:67
|
作者
Schulze, C [1 ]
Lienert, U
Hanfland, M
Lorenzen, M
Zontone, F
机构
[1] Paul Scherrer Inst, Swiss Light Source, CH-5232 Villigen, Switzerland
[2] European Synchrotron Radiat Facil, F-38043 Grenoble, France
[3] Riso Natl Lab, Dept Mat, DK-4000 Roskilde, Denmark
关键词
bent-crystal monochromators; microfocusing; geometrical theory; polychromatic focus broadening;
D O I
10.1107/S0909049597014568
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
High-energy X-ray focusing with bent-crystal monochromators is known to be hampered by so-called depth or crystal-thickness aberrations. A theoretical model of focus broadening based on the geometrical theory of X-ray diffraction in slightly deformed crystals is presented and compared with experimental data. First, it is shown that depth broadening can be avoided in the Laue geometry by an appropriate choice of asymmetry angle. Based on this finding, a monochromator for high-pressure diffraction experiments has been designed and a source-size-limited focal spot below 10 mu m is observed. As a consequence of the box-shaped rocking curve of bent Laue crystals, the focus is free of long-ranging tails. Diffraction patterns of standard powder samples were recorded on imaging plates and a theoretical description of the energy-dispersion-related peak broadening is given. Finally, diffraction patterns of N-2 at 180 kbar demonstrate the excellent data quality achievable with this monochromator.
引用
收藏
页码:77 / 81
页数:5
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