Mechanism equivalence analysis, focusing on the underlying quantitative relationship between degradation model parameters under different stress levels when the accelerated failure mechanism remains unchanged, has been developed and adopted widely in accelerated degradation tests (ADTs) over recent years. For a specific degradation process, the mechanism equivalence conditions can be derived based on the acceleration factor invariant principle and further utilized to test whether the accelerated failure mechanism remains unchanged or not under different stress levels. In this paper, a unified form of the mechanism equivalence conditions for commonly-used stochastic process models is derived based on Tweedie exponential dispersion process. The unified form can cover the conditions of Wiener, Gamma and inverse Gaussian processes, etc. Based on this, a complete procedure for mechanism equivalence test of ADT is proposed through the joint application of normality test and parameter hypothesis tests. In this way, the availability of the ADT data can be distinguished before using them for lifetime prediction of products. In addition, the effects caused by degradation model mis-specification and ADT data misuse are further analyzed from the perspective of relative error. A simulation example and two real-world case studies are used to demonstrate the effectiveness of the proposed methods.
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Korea Adv Inst Sci & Technol, Dept Ind & Syst Engn, Taejon 305701, South KoreaKorea Adv Inst Sci & Technol, Dept Ind & Syst Engn, Taejon 305701, South Korea
Lim, Heonsang
Yum, Bong-Jin
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Korea Adv Inst Sci & Technol, Dept Ind & Syst Engn, Taejon 305701, South KoreaKorea Adv Inst Sci & Technol, Dept Ind & Syst Engn, Taejon 305701, South Korea
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Sun Yat Sen Univ, Sch Intelligent Syst Engn, Shenzhen Campus, Shenzhen, Peoples R China
City Univ Hong Kong, Dept Adv Design & Syst Engn, Hong Kong, Peoples R ChinaSun Yat Sen Univ, Sch Intelligent Syst Engn, Shenzhen Campus, Shenzhen, Peoples R China
Ding, Yi
Zhu, Rong
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Sun Yat Sen Univ, Sch Intelligent Syst Engn, Shenzhen Campus, Shenzhen, Peoples R ChinaSun Yat Sen Univ, Sch Intelligent Syst Engn, Shenzhen Campus, Shenzhen, Peoples R China
Zhu, Rong
Peng, Weiwen
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Sun Yat Sen Univ, Sch Intelligent Syst Engn, Shenzhen Campus, Shenzhen, Peoples R ChinaSun Yat Sen Univ, Sch Intelligent Syst Engn, Shenzhen Campus, Shenzhen, Peoples R China
Peng, Weiwen
Xie, Min
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City Univ Hong Kong, Dept Adv Design & Syst Engn, Hong Kong, Peoples R China
City Univ Hong Kong, Sch Data Sci, Hong Kong, Peoples R ChinaSun Yat Sen Univ, Sch Intelligent Syst Engn, Shenzhen Campus, Shenzhen, Peoples R China
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Hong Kong Inst Educ, Dept Math & Informat Technol, Tai Po, Hong Kong, Peoples R ChinaHong Kong Inst Educ, Dept Math & Informat Technol, Tai Po, Hong Kong, Peoples R China
Ling, Man Ho
Tsui, Kwok Leung
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City Univ Hong Kong, Dept Syst Engn & Engn Management, Ind Engn, Kowloon, Hong Kong, Peoples R ChinaHong Kong Inst Educ, Dept Math & Informat Technol, Tai Po, Hong Kong, Peoples R China
Tsui, Kwok Leung
Balakrishnan, Narayanaswamy
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McMaster Univ, Dept Math & Stat, Hamilton, ON L8S 4K1, CanadaHong Kong Inst Educ, Dept Math & Informat Technol, Tai Po, Hong Kong, Peoples R China