Mechanism equivalence analysis for accelerated degradation tests based on tweedie exponential dispersion process

被引:5
|
作者
Wang, Han [1 ]
Ma, Xiaobing [2 ]
Bao, Rui [1 ]
Zhou, Kun [3 ]
机构
[1] Beihang Univ, Sch Aeronaut Sci & Engn, Beijing, Peoples R China
[2] Beihang Univ, Sch Reliabil & Syst Engn, Beijing 100191, Peoples R China
[3] Southwest Inst Technol & Engn, Res Ctr Nat Environm Test, Chongqing, Peoples R China
来源
基金
中国国家自然科学基金;
关键词
Mechanism equivalence analysis; accelerated degradation test; mis-specification analysis; Tweedie exponential dispersion process; PROCESS MODELS;
D O I
10.1080/16843703.2022.2071536
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Mechanism equivalence analysis, focusing on the underlying quantitative relationship between degradation model parameters under different stress levels when the accelerated failure mechanism remains unchanged, has been developed and adopted widely in accelerated degradation tests (ADTs) over recent years. For a specific degradation process, the mechanism equivalence conditions can be derived based on the acceleration factor invariant principle and further utilized to test whether the accelerated failure mechanism remains unchanged or not under different stress levels. In this paper, a unified form of the mechanism equivalence conditions for commonly-used stochastic process models is derived based on Tweedie exponential dispersion process. The unified form can cover the conditions of Wiener, Gamma and inverse Gaussian processes, etc. Based on this, a complete procedure for mechanism equivalence test of ADT is proposed through the joint application of normality test and parameter hypothesis tests. In this way, the availability of the ADT data can be distinguished before using them for lifetime prediction of products. In addition, the effects caused by degradation model mis-specification and ADT data misuse are further analyzed from the perspective of relative error. A simulation example and two real-world case studies are used to demonstrate the effectiveness of the proposed methods.
引用
收藏
页码:722 / 748
页数:27
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