Extraction of phase derivative data from interferometer images using a continuous wavelet transform to determine two-dimensional refractive index profiles

被引：6
|
作者：
Oven, R. [1 ]
机构：
[1] Univ Kent, Sch Engn & Digital Arts, Canterbury CT2 7NT, Kent, England
来源：
APPLIED OPTICS | 2010年 / 49卷 / 22期
关键词：
SPECKLE PATTERN INTERFEROMETRY; FRINGE PATTERN; FOURIER-TRANSFORM; TEMPORAL CARRIER; SPATIAL CARRIER; ION-EXCHANGE; GUIDES; DEMODULATION; ALGORITHM; RIDGES;
D O I：
10.1364/AO.49.004228
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Two-dimensional refractive index profiles of ion exchanged channel waveguides in glass have been obtained from the analysis of interferometer data. To obtain depth data, a shallow bevel is produced in the glass by polishing. The refractive index profile information that is contained within the derivative of the phase data is extracted directly using a continuous wavelet transform algorithm. The algorithm used to characterize and smooth the wavelet ridge is discussed in detail. (C) 2010 Optical Society of America
引用
收藏
页码：4228 / 4236
页数：9
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