Two-dimensional continuous wavelet transform algorithm for phase extraction of two-step arbitrarily phase-shifted interferograms

被引：33
|
作者：
Ma, Jun [1 ,2 ]
Wang, Zhaoyang [1 ]
Pan, Tongyan [3 ]
机构：
[1] Catholic Univ Amer, Dept Mech Engn, Washington, DC 20064 USA
[2] Guilin Univ Elect Technol, Sch Elect Engn & Automat, Guilin 541004, Peoples R China
[3] Catholic Univ Amer, Dept Civil Engn, Washington, DC 20064 USA
来源：
OPTICS AND LASERS IN ENGINEERING | 2014年 / 55卷
基金：
美国国家科学基金会;
关键词：
Interferogram analysis; Fringe pattern analysis; Phase-shifting technique; Continuous wavelet transform; Phase extraction; FRINGE PATTERN-ANALYSIS; INTERFEROMETRY; DEMODULATION; MAPS;
D O I：
10.1016/j.optlaseng.2013.11.009
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
By virtue of the anti-noise and anti-defect abilities, in this paper, a two-dimensional continuous wavelet transform algorithm is proposed to analyze two-step arbitrarily phase-shifted interferograms with an orthonormalization process. The novel algorithm takes the advantages of the two existing ones, and it has a remarkable ability to accurately and automatically extract full-field phase distribution from two phase-shifted interferograms where they may contain arbitrary and unknown phase shift, complex fringes with phase ambiguity, large fringe-frequency variations, noise, defects and corrupted fringes. The validity of the algorithm is demonstrated by both computer simulation and real experiments. (C) 2013 Elsevier Ltd. All rights reserved.
引用
收藏
页码：205 / 211
页数：7
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