Convolution blocks based on self-checking operators

被引:0
|
作者
Franco, D. T. [1 ]
Naviner, J.-F. [1 ]
Naviner, L. [1 ]
机构
[1] GET TELECOM PARIS, Paris, France
关键词
reliability; self-checking; CED; parity prediction; parity checking; signed digit representation; convolution;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The arrival of CMOS integrated systems into nanoscale dimensions is presenting many challenges to designers and manufacturers concerning yield and reliability of integrated circuits. Traditional techniques to cope with these subjects are not as effective as they were before and many solutions are considered to allow CMOS evolution to continue according to Moore's law. Among the proposed solutions in the literature there's self-checking design and circuit reconfiguration. In the present work we introduce self-checking arithmetic operators in the design of convolution processors and we verify the penalties of such solutions in terms of area and speed. The self-checking methods considered are parity prediction, duplication and 1-out-of-3 encoding.
引用
收藏
页码:487 / 491
页数:5
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