Atom trap trace analysis of krypton in xenon for the XENON Dark Matter Project

被引：1
|
作者：
Aprile, E. [1 ]
Daw, D. [1 ,2 ]
Greene, Z. [1 ]
Plante, G. [1 ]
Zhu, T. [1 ]
机构：
[1] Columbia Univ, Dept Phys, 538 West 120th St, New York, NY 10027 USA
[2] CUNY, Dept Phys, New York, NY 10021 USA
来源：
JOURNAL OF INSTRUMENTATION | 2018年 / 13卷
基金：
美国国家科学基金会;
关键词：
Dark Matter detectors (WIMPS; axions; etc.); Ion identification systems; Laser cooling; Plasma generation (laser-produced; RF; x ray-produced); SYSTEM;
D O I：
10.1088/1748-0221/13/10/P10018
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
We report on the first atom trap trace analysis (ATTA) measurements of Kr in Xe samples with Kr/Xe concentrations of O (10 ppt)(3) and O(100 ppt). The ATTA results were independently confirmed by measurements of the same samples with a rare gas mass spectrometer. Measurements of samples with Kr/Xe concentrations below these levels were inhibited by a residual Kr background in the ATTA apparatus, attributed to a cumulative cross sample contamination due to the radio frequency plasma discharge source region from tests with Kr-rich gas samples.
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页数：10
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