A variation of the F-Test for determining statistical relevance of particular parameters in EXAFS fits

被引:0
|
作者
Downward, L. [1 ,2 ]
Booth, C. H. [2 ]
Lukens, W. W. [2 ]
Bridges, F. [1 ]
机构
[1] Univ Calif Santa Cruz, Dept Phys, Santa Cruz, CA 95060 USA
[2] Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Div Chem Sci, Berkeley, CA 94720 USA
来源
关键词
EXAFS; F-Test; Hamilton test;
D O I
暂无
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A general problem when fitting EXAFS data is determining whether particular parameters are statistically significant. The F-test is an excellent way of determining relevancy in EXAFS because it only relies on the ratio of the fit residual of two possible models, and therefore the data errors approximately cancel. Although this test is widely used in crystallography (there, it is often called a "Hamilton test") and has been properly applied to EXAFS data in the past, it is very rarely applied in EXAFS analysis. We have implemented a variation of the F-test adapted for EXAFS data analysis in the RSXAP analysis package, and demonstrate its applicability with a few examples, including determining whether a particular scattering shell is warranted, and differentiating between two possible species or two possible structures in a given shell.
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页码:129 / +
页数:2
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