An inverse problem of estimating the heat source in tapered optical fibers for scanning near-field optical microscopy

被引:22
|
作者
Lee, Haw-Long [1 ]
Chang, Win-Jin [1 ]
Chen, Wen-Lih [1 ]
Yang, Yu-Ching [1 ]
机构
[1] Kun Shan Univ, Dept Mech Engn, Tainan 710032, Taiwan
关键词
inverse problem; conjugate gradient method; heat source; tapered optical fiber; scanning near-field optical microscopy;
D O I
10.1016/j.ultramic.2007.01.001
中图分类号
TH742 [显微镜];
学科分类号
摘要
A conjugate gradient method based on inverse algorithm is applied in this study to estimate the unknown space- and time-dependent heat source in aluminum-coated tapered optical fibers for scanning near-field optical microscopy, by reading the transient temperature data at the measurement positions. No prior information is available on the functional form of the unknown heat source in the present study; thus, it is classified as the function estimation in inverse calculation. The accuracy of the inverse analysis is examined by using the simulated exact and inexact temperature measurements. Results show that an excellent estimation on the heat source and temperature distributions in the tapered optical fiber can be obtained for all the test cases considered in this study. (C) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:656 / 662
页数:7
相关论文
共 50 条
  • [31] Antenna-based near-field scanning optical microscopyAntenna-based near-field scanning optical microscopy
    Hamann, HF
    Testing, Reliability, and Application of Micro- and Nano-Material Systems III, 2005, 5766 : 126 - 133
  • [32] Scanning near-field optical microscopy and near-field optical probes: properties, fabrication, and control of parameters
    Dryakhlushin, V. F.
    Veiko, V. P.
    Voznesenskii, N. B.
    QUANTUM ELECTRONICS, 2007, 37 (02) : 193 - 203
  • [33] Near-field scanning optical microscopy and near-field confocal optical spectroscopy: Emerging techniques in biology
    MarcheseRagona, SP
    Haydon, PG
    IMAGING BRAIN STRUCTURE AND FUNCTION: EMERGING TECHNOLOGIES IN THE NEUROSCIENCES, 1997, 820 : 196 - 207
  • [34] Optical processing by scanning near-field optical/atomic force microscopy
    Seiko Instruments Inc, Chiba, Japan
    Thin Solid Films, 1-2 (327-330):
  • [35] OPTICAL CHARACTERIZATION OF NANOSOURCES USED IN SCANNING NEAR-FIELD OPTICAL MICROSCOPY
    VANLABEKE, D
    BARCHIESI, D
    BAIDA, F
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1995, 12 (04): : 695 - 703
  • [36] Optical characterization of nanosources used in scanning near-field optical microscopy
    Univ de Franche-Comte, Besancon, France
    Journal of the Optical Society of America A: Optics and Image Science, and Vision, 1995, 12 (04): : 695 - 703
  • [37] Optical processing by scanning near-field optical/atomic force microscopy
    Nakajima, K
    Muramastu, H
    Chiba, N
    Ataka, T
    Fujihira, M
    THIN SOLID FILMS, 1996, 273 (1-2) : 327 - 330
  • [38] Dual-optical-mode near-field scanning optical microscopy
    Wei, PK
    Hsu, JH
    Fann, WS
    Tsai, KT
    APPLIED OPTICS, 1996, 35 (34): : 6727 - 6731
  • [39] Video rate near-field scanning optical microscopy
    Bukofsky, SJ
    Grober, RD
    APPLIED PHYSICS LETTERS, 1997, 71 (19) : 2749 - 2751
  • [40] Surface plasmon scanning near-field optical microscopy
    Kryukov, AE
    Kim, YK
    Ketterson, JB
    JOURNAL OF APPLIED PHYSICS, 1997, 82 (11) : 5411 - 5415