Discussion on method of optical surface roughness measurement

被引:3
|
作者
Wang, Chunyang [1 ]
Lv, Dongmei [1 ]
Shi, Hongwei [1 ]
Liu, Xuelian [1 ]
Xin, Ruihao [1 ]
机构
[1] Changchun Univ Sci & Technol, Coll Elect Informat Engn, Changchun 130000, Peoples R China
来源
SECOND INTERNATIONAL CONFERENCE ON PHOTONICS AND OPTICAL ENGINEERING | 2017年 / 10256卷
关键词
surface roughness; Optical elements; Measurement; LIGHT-SCATTERING;
D O I
10.1117/12.2260711
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In recent years, with the development of modern optics and laser technology, modern industry for optical surface roughness measurement precision of the increasingly high demand, real-time, fast and precise measurement of surface roughness has become constant subject of optical components in processing and test. In this paper, the current method of measuring the surface roughness of optical components were described in detail, including light scattering method, interferometric method, speckle method, and optical stylus method. Besides, the principles and characteristics of different methods were introduced respectively.
引用
收藏
页数:6
相关论文
共 50 条
  • [31] Measurement of Curved Surface Roughness by Polychromatic Speckle Method
    Huang, Jing
    Yuan, Zongheng
    Ge, Yifan
    MATERIALS PROCESSING TECHNOLOGY II, PTS 1-4, 2012, 538-541 : 256 - +
  • [32] Impact of silicon surface roughness on device performance and novel roughness measurement method
    Nemoto, Kazunori
    Watanabe, Kenji
    Hayashi, Toshiyuki
    Tsugane, Ken
    Tamaki, Yoichi
    Ota, Hideo
    Funakoshi, Tomohiro
    2007 IEEE/SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE, 2007, : 158 - +
  • [33] OPTICAL MEASUREMENT OF ROUGHNESS
    SLAVIK, J
    HOFLER, H
    F&M-FEINWERKTECHNIK & MESSTECHNIK, 1988, 96 (06): : 258 - 262
  • [34] Design and performance of an optical sensor for the measurement of surface roughness and waviness
    Docchio, F
    Minoni, U
    Rodella, R
    Rovati, L
    Corallo, V
    LASER METROLOGY AND INSPECTION, 1999, 3823 : 160 - 163
  • [35] A Rapid Optical System for Surface Roughness Measurement of Hard Films
    Kuo, C. C.
    Siao, Y. T.
    2012 IEEE INTERNATIONAL CONFERENCE ON INDUSTRIAL ENGINEERING AND ENGINEERING MANAGEMENT (IEEM), 2012, : 2365 - 2369
  • [36] Rapid optical measurement of surface roughness of polycrystalline thin films
    Kuo, Chil-Chyuan
    Chao, Chin-Sheng
    OPTICS AND LASERS IN ENGINEERING, 2010, 48 (12) : 1166 - 1169
  • [37] Measurement on roughness of optical surface by focal plane CCD camera
    Li, JB
    Li, XY
    Ying, AH
    Zao, AQ
    Zhang, XL
    FLATNESS, ROUGHNESS, AND DISCRETE DEFECTS CHARACTERIZATION FOR COMPUTER DISKS, WAFERS, AND FLAT PANEL DISPLAYS II, 1998, 3275 : 84 - 87
  • [38] Surface roughness measurement
    Thurmes, P
    PHOTONICS SPECTRA, 1997, 31 (09) : 80 - 80
  • [39] Measurement of surface roughness
    Miyamoto, K
    JOURNAL OF JAPANESE SOCIETY OF TRIBOLOGISTS, 1998, 43 (11) : 925 - 932
  • [40] A new non-contact measurement method of surface roughness
    Hui, M
    Niu, HB
    ISTM/99: 3RD INTERNATIONAL SYMPOSIUM ON TEST AND MEASUREMENT, 1999, : 886 - 888