Test and Diagnosis of Power Switches

被引：0

作者：

Valka, M. ^{[1
,2
]}

Bosio, A. ^{[1
]}

Dilillo, L. ^{[1
]}

Todri, A. ^{[1
]}

Virazel, A. ^{[1
]}

Girard, P. ^{[1
]}

Debaud, P. ^{[2
]}

Guilhot, S. ^{[2
]}

机构：

[1] Univ Montpellier 2, CNRS, LIRMM, Montpellier, France

[2] ST Microelect, Grenoble, France

来源：

PROCEEDINGS OF THE 2014 IEEE 17TH INTERNATIONAL SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS & SYSTEMS (DDECS) | 2014年

关键词：

Power Switch; Power Management; Design for Test & Diagnosis;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Power-gating techniques have been adopted so far to reduce the static power consumption of an Integrated Circuit (IC). Power gating is usually implemented by means of several power switches. Manufacturing defects affecting power switches can lead to increase the actual static power consumption and, in the worst case they can completely isolate a functional block of the IC. In this paper we present a novel Design for Test & Diagnosis to increase the test quality and diagnosis accuracy of power switches. The proposed approach has been validated through SPICE simulations on ITC'99 benchmark circuits.

引用

页码：213 / 218

页数：6

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