Structural study of sputtered nanocrystalline Ti and Zr by X-ray diffraction

被引：0
|
作者：
Shi, WZ [1 ]
Yao, RH [1 ]
Lin, KX [1 ]
Lin, XY [1 ]
机构：
[1] Shantou Univ, Dept Phys, Shantou 515063, Peoples R China
来源：
CHINESE SCIENCE BULLETIN | 1997年 / 42卷 / 22期
关键词：
nanocrystalline Ti and Zr; structure; X-ray diffraction;
D O I：
10.1007/BF02882781
中图分类号：
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号：
07 ; 0710 ; 09 ;
摘要：
[No abstract available]
引用
收藏
页码：1880 / 1883
页数：4
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