Impedance spectroscopy and capacitance - voltage measurements analysis: Impact of charge carrier lifetimes and mapping vertical segregation in bulk heterojunction P3HT: PCBM solar cells

被引：17
|
作者：
Oklobia, O. [1 ]
Komilian, S. [2 ]
Sadat-Shafai, T. [2 ]
机构：
[1] Swansea Univ, Coll Engn, Ctr Solar Energy Res, OpT Ctr, St Asaph Business Pk, St Asaph LL17 0JD, Wales
[2] Staffordshire Univ, Sci Ctr, Thin Film Lab, Sch Engn & Creat Art, Leek Rd, Stoke On Trent ST4 2DF, Staffs, England
来源：
ORGANIC ELECTRONICS | 2018年 / 61卷
关键词：
Characterisation; Impedance spectroscopy; Capacitance; Voltage; Flat band potential; Charge Carrier lifetime; Vertical segregation; CONTACT SELECTIVITY; EQUIVALENT-CIRCUIT; POLYMER; MORPHOLOGY; LAYER; TRANSPORT; MOBILITY; NANOMORPHOLOGY; PERFORMANCE; INTERFACES;
D O I：
10.1016/j.orgel.2018.06.003
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Impedance spectroscopy measurement is employed to study the impact of thermal annealing on charge carrier lifetimes in P3HT: PCBM bulk heterojunction solar cells. Upon thermal annealing at 150 degrees C, a correlation between charge carrier lifetime and device performance is identified. The best power conversion efficiency reported here corresponds to the devices annealed at 150 degrees C, yielding the longest charge carrier life time. In addition to lateral segregation, thermal annealing promotes accumulation of PCBM molecular aggregates towards the cathode inducing vertical segregation as is evident from the analysis of results obtained from capacitance - voltage measurements. Based on Mott-Schottky relation, the measured values of the flat band potential as a function of thermal annealing is correlated to the concentration of PCBM at cathode interface and a compositional gradient profile induced by thermal annealing is proposed.
引用
收藏
页码：276 / 281
页数：6
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