Time-domain fault diagnosis of analogue circuits in the presence of noise

被引：5
|
作者：
Brygilewicz, V [1 ]
Wojciechowski, J [1 ]
机构：
[1] Warsaw Univ Technol, Inst Radioelect, PL-00665 Warsaw, Poland
来源：
IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS | 1998年 / 145卷 / 02期
关键词：
multiple fault diagnosis; algorithms; noise; analogue circuits;
D O I：
10.1049/ip-cds:19981744
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
An approach to multiple fault diagnosis in dynamic linear and nonlinear circuits based on testing of actual and simulation of nominal circuit is presented. Time domain integral sensitivity is used for constructing test equations. An adaptive algorithm for selecting time intervals for integral sensitivity is included. The least squares approach (LSA) to solve overdetermined diagnosis equations with noisy data is used in conjunction with the regularisation method of Tikhonov. Three illustrative examples show applications of the method.
引用
收藏
页码：125 / 131
页数：7
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