Near-field microwave diagnostics with nonlinear-optical sensors

被引：0

作者：

Whitaker, John F. ^{[1
,2
,3
]}

Yang, Kyoung ^{[3
]}

Chen, Chia-Chu ^{[1
,2
]}

机构：

[1] Univ Michigan, Ctr Ultrafast Opt Sci, 2200 Bonisteel Blvd,Rm 1006, Ann Arbor, MI 48109 USA

[2] Univ Michigan, Dept Elect Engn & Comp Sci, Ann Arbor, MI 48109 USA

[3] Opteos Inc, Ann Arbor, MI 48108 USA

来源：

ULTRAFAST PHENOMENA IN SEMICONDUCTORS AND NANOSTRUCTURE MATERIALS XI AND SEMICONDUCTOR PHOTODETECTORS IV | 2007年 / 6471卷

关键词：

microwave field-mapping; electro-optic sensing; magneto-optic sensing; near-field diagnostics; microwave photonics; diluted magnetic semiconductors;

D O I：

10.1117/12.707781

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The concept and implementation of a near-field microwave measurement system that relies on the Pockels effect in fiber-coupled, semi-insulating GaAs probes to acquire polarization-sensitive maps of electric-field patterns in close proximity to antenna arrays, integrated circuits, and packaged components, is presented. The evolution of the electro-optic field-mapping technique, which has subsequently addressed magnetic-field characterization via magneto-optic sensing and temperature measurement through semiconductor band-gap modulation, will also be discussed. The use of emerging materials, such as diluted magnetic semiconductors, is also considered.

引用

页数：9

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