Thickness dependence of the properties of La0.6Sr0.4MnO3 thin films

被引：32
|
作者：
Sirena, M
Steren, L
Guimpel, J [1 ]
机构：
[1] Comis Nacl Energia Atom, Ctr Atom Bariloche, RA-8400 Bariloche, Rio Negro, Argentina
[2] Inst Balseiro, RA-8400 Bariloche, Rio Negro, Argentina
[3] CONICET, RA-1033 Buenos Aires, DF, Argentina
来源：
THIN SOLID FILMS | 2000年 / 373卷 / 1-2期
关键词：
growth mechanism; interfaces; magnetic properties and measurements; sputtering;
D O I：
10.1016/S0040-6090(00)01113-5
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We have studied the thickness dependence of the transport and magnetic properties of strongly textured La0.6Sr0.4MnO3 thin films grown on MgO and SrTiO3, for thickness between 5 and 500 nm. While the resistivity and the magnetoresistance are strongly affected, the magnetization is only moderately changed. The effect on the metal-insulator transition, the low field magnetoresistance and carrier localization is dependent on the substrate, evidencing the effect of the induced defects and strains. (C) 2000 Elsevier Science S.A. All rights reserved.
引用
收藏
页码：102 / 106
页数：5
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