Thermal analysis of GaN-based LEDs using the finite element method and unit temperature profile approach

被引:15
|
作者
Lee, TH
Kim, L
Hwang, WJ
Lee, CC
Shin, MW
机构
[1] Myong Ji Univ, Dept Ceram Engn, Semicond Mat & Devices Lab, Yongin 449728, Kyunggi Do, South Korea
[2] Univ Calif Irvine, Dept Elect & Comp Engn, Irvine, CA 92717 USA
来源
关键词
D O I
10.1002/pssb.200405099
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
This paper reports on the thermal modelling of GaN-based LEDs. The theoretical calculation was made by combining an analytical simulation employing the Unit Temperature Profile Approach (UTPA) and Finite Element Method (FEM). An interfacing process was made by the optimization of the modelling input parameters used in the analytical simulator. The calculated temperatures of the LED chip inside the epoxy package was compared with the experimentally measured data and the optimized heat transfer coefficients were extracted. The extracted parameters were implemented into the numerical thermal calculation of the package surface using FEM. By the effective interfacing process between the two modelling tools, it is demonstrated that the analytical simulator can be utilized for the accurate prediction of the surface temperatures of LED packaging with non-flat surface. (C) 2004 WILEY-VCH Vertag GmbH & Co. KGaA, Weinheim.
引用
收藏
页码:2681 / 2684
页数:4
相关论文
共 50 条
  • [41] Precise Temperature Mapping of GaN-Based LEDs by Quantitative Infrared Micro-Thermography
    Chang, Ki Soo
    Yang, Sun Choel
    Kim, Jae-Young
    Kook, Myung Ho
    Ryu, Seon Young
    Choi, Hae Young
    Kim, Geon Hee
    SENSORS, 2012, 12 (04) : 4648 - 4660
  • [42] Thermal Stress Calculation Method for Concrete Pavement Based on Temperature Prediction and Finite Element Method Analysis
    Nishizawa, Tatsuo
    Koyanagawa, Masashi
    Takeuchi, Yasusi
    Kubo, Kazuyuki
    Yoshimoto, Toru
    TRANSPORTATION RESEARCH RECORD, 2017, (2640) : 104 - 114
  • [43] Finite Element Analysis of Profile Grinding Temperature
    Lishchenko, Natalia
    Larshin, Vasily
    Uminsky, Sergey
    ADVANCES IN DESIGN, SIMULATION AND MANUFACTURING III: MANUFACTURING AND MATERIALS ENGINEERING, VOL 1, 2020, : 422 - 431
  • [44] Effect of Junction Temperature on EL Spectra of GaN-Based White High Voltage LEDs
    Li Song-yu
    Guo Wei-ling
    Sun Jie
    Chen Yan-fang
    Lei Jun
    SPECTROSCOPY AND SPECTRAL ANALYSIS, 2017, 37 (01) : 37 - 41
  • [45] ESD on GaN-based LEDs: An analysis based on dynamic electroluminescence measurements and current waveforms
    Dal Lago, M.
    Meneghini, M.
    De Santi, C.
    Barbato, M.
    Trivellin, N.
    Meneghesso, G.
    Zanoni, E.
    MICROELECTRONICS RELIABILITY, 2014, 54 (9-10) : 2138 - 2141
  • [46] Finite element analysis of the temperature profile of rolls
    Baskiyar, R
    STEEL RESEARCH, 2000, 71 (04): : 115 - 117
  • [47] Thermal analysis of GaN-based laser diode package
    Hwang, W. J.
    Lee, T. H.
    Nam, O. H.
    Kim, H. K.
    Kwak, J. S.
    Park, Y. J.
    Shin, M. W.
    PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 3, NO 6, 2006, 3 (06): : 2174 - 2177
  • [48] A Top-Down Approach for Fabrication of Nanorods on GaN-Based LEDs Using Self-Assembled Ni
    Jakhar, Alka
    Mathew, Manish
    Chauhan, Ashok
    Singh, Kuldip
    Janyani, Vijay
    Gupta, Nikhil Deep
    OPTICAL AND WIRELESS TECHNOLOGIES, OWT 2017, 2018, 472 : 171 - 176
  • [49] Ablative Thermal Response Analysis Using the Finite Element Method
    Dec, John A.
    Braun, Robert D.
    Laub, Bernard
    JOURNAL OF THERMOPHYSICS AND HEAT TRANSFER, 2012, 26 (02) : 201 - 212
  • [50] Thermal Analysis of Electron Gun Using Finite Element Method
    Xie, Peng
    Xu, Li
    Li, Bin
    2017 EIGHTEENTH INTERNATIONAL VACUUM ELECTRONICS CONFERENCE (IVEC), 2017,