Statistical inference for masked data

被引:2
|
作者
Reiser, B [1 ]
Yashchin, E
Flehinger, BJ
机构
[1] Univ Haifa, Dept Stat, IL-31999 Haifa, Israel
[2] IBM Corp, Thomas J Watson Res Ctr, Dept Math Sci, Div Res, Yorktown Heights, NY 10598 USA
关键词
competing causes; Kaplan-Meier; proportional hazards; reliability;
D O I
10.1016/S0362-546X(97)00322-2
中图分类号
O29 [应用数学];
学科分类号
070104 ;
摘要
[No abstract available]
引用
收藏
页码:4425 / 4432
页数:8
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