Comprehensive Study of Copper Nano-paste for Cu-Cu Bonding

被引:2
|
作者
Chong, Ser Choong [1 ]
Sharon, Pei Siang Lim [1 ]
机构
[1] ASTAR, Inst Microelect, 2 Fusionopolis Way,08-02 Innovis Tower, Singapore 138634, Singapore
关键词
Cu nano-paste; Cu micro-bump; Formic acid; PITCH;
D O I
10.1109/ECTC.2019.00036
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Cu-Cu bond is a prefer solution for shrinking interconnect pitch as it offered lower interconnect resistance with no intermetallic compound risk. Major challenge in Cu-Cu bond is the formation of copper oxide and also the long thermal process. Several approaches had been proposed in the industry to overcome the challenges are diffusion bonding, ultra-sonic bonding, Cu nano-paste, use of Formic acid and argon plasma for copper surface treatment and bit grinding process to enable good Cu-Cu bond. In this paper, we explore the use of Cu nano-paste as the bonding medium between Cu bump and Cu pad. Cu nano-paste is an attractive solution for Cu-Cu bond as it deploy similar approach as conventional solder bump flip chip process. The flux used in conventional solder bump flip chip process is replaced by Cu nano-paste and the conventional reflow oven is replaced by Formic Acid Chamber. We had demonstrated good formic acid process in dealing with Cu nano-paste in terms of low resistance value and prestige copper surface.
引用
收藏
页码:191 / 196
页数:6
相关论文
共 50 条
  • [31] A new approach to Cu-Cu direct bump bonding
    Suga, T
    Yuuki, F
    Hosoda, N
    1ST 1997 IEMT/IMC SYMPOSIUM, 1997, : 146 - 151
  • [32] Wafer-level Cu-Cu bonding technology
    Tang, Ya-Sheng
    Chang, Yao-Jen
    Chen, Kuan-Neng
    MICROELECTRONICS RELIABILITY, 2012, 52 (02) : 312 - 320
  • [33] Potassium-activated anionic copper and covalent Cu-Cu bonding in compressed K-Cu compounds
    Cao, Xuyan
    Wan, Biao
    Liu, Hanyu
    Wu, Lailei
    Yao, Yansun
    Gou, Huiyang
    JOURNAL OF CHEMICAL PHYSICS, 2021, 154 (13):
  • [34] Optimal Cu paste thickness for large-area Cu-Cu joint
    Wu, Lingmei
    Qian, Jing
    Yu, Jiabing
    Guo, Haojie
    Chen, Xianping
    MATERIALS LETTERS, 2021, 291
  • [35] Collective Cu-Cu thermocompression bonding using pillars
    Carroll R.
    La Tulipe D.
    Coolbaugh D.
    Geer R.
    Journal of Microelectronics and Electronic Packaging, 2019, 16 (01): : 28 - 38
  • [36] Electromigration and Temperature Cycling Tests of Cu-Cu Joints Fabricated by Instant Copper Direct Bonding
    Shie, Kai-Cheng
    Hsu, Po-Ning
    Li, Yu-Jin
    Tu, K. N.
    Lin, Benson Tzu-Hung
    Chang, Chia-Cheng
    Chen, Chih
    IEEE 71ST ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2021), 2021, : 995 - 1000
  • [37] Recent Advances and Trends in Cu-Cu Hybrid Bonding
    Lau, John H.
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2023, 13 (03): : 399 - 425
  • [38] Low temperature Cu-Cu bonding using copper nanoparticles fabricated by high pressure PVD
    Wu, Zijian
    Cai, Jian
    Wang, Qian
    Wang, Junqiang
    AIP ADVANCES, 2017, 7 (03)
  • [39] Hybrid Cu-to-Cu bonding with nano-twinned Cu and non-conductive paste
    Kuo, Yu-Hao
    Tran, Dinh-Phuc
    Ong, Jia-Juen
    Tu, K. N.
    Chen, Chih
    JOURNAL OF MATERIALS RESEARCH AND TECHNOLOGY-JMR&T, 2022, 18 : 859 - 871
  • [40] Fine-Pitch 30 μm Cu-Cu Bonding using Electroless Nano-Ag
    Lin, Yung-Sheng
    Chiang, Chun-Wei
    Hung, Yun-Ching
    Kao, Chin-Li
    Hsieh, Ping-Hung
    Hsu, Chih-Yuan
    Lin, I-Ting
    2023 IEEE 73RD ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE, ECTC, 2023, : 1115 - 1118