Some thoughts on sine wave ADC testing

被引：2

作者：

Sugawara, H ^{[1
]}

Kobayashi, H ^{[1
]}

Arpaia, P ^{[1
]}

机构：

[1] Gunma Univ, Dept Elect Engn, Kiryu, Gumma 3768515, Japan

来源：

IMTC/2000: PROCEEDINGS OF THE 17TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE: SMART CONNECTIVITY: INTEGRATING MEASUREMENT AND CONTROL | 2000年

关键词：

ADC; ADC testing; sine wave testing; sampling theorem; slew rate; phase-plane;

D O I：

10.1109/IMTC.2000.846840

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper proposes state-transition plane and error plane methods to identify the ADC error type (such as additive noise, multiplicative noise, jitter and harmonics) in the sine wave ADC testing, and the theoretical analysis and simulation results demonstrate their effectiveness. Also an ADC output waveform reconstruction algorithm which is applicable for an incoherent sampling ADC testing is proposed. These results would be useful for developing new error correction algorithms and analyzing the sine wave ADC testing theoretically as well as identifying ADC error sources.

引用

页码：125 / 130

页数：6

共 50 条

[41] ADC testing methods
Baccigalupi, A.
Measurement: Journal of the International Measurement Confederation, 1999, 26 (03): : 199 - 205
[42] Some thoughts on the use of replacement alternatives for toxicity testing and risk assessment
Robert D. Combes
Archives of Toxicology, 2009, 83 : 199 - 201
[43] ADC Testing With Verification
Fodor, Balazs
Kollar, Istvan
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2008, 57 (12) : 2762 - 2768
[44] ADC modeling and testing
Chiorboli, G
Morandi, C
IMTC/2001: PROCEEDINGS OF THE 18TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-3: REDISCOVERING MEASUREMENT IN THE AGE OF INFORMATICS, 2001, : 1992 - 1999
[45] QUANTIZING NOISE FOR A SINE WAVE AND A SET OF SINE WAVES
FUJII, A
AZEGAMI, K
REVIEW OF THE ELECTRICAL COMMUNICATIONS LABORATORIES, 1967, 15 (3-4): : 145 - &
[46] MODELING AND SIMULATION OF SINE WAVE TO SINE WAVE CONVERTER FOR AC DRIVE - A TECHNOLOGY REVIEW
Mahendran, N.
Gurusamy, G.
ICMEE 2009: PROCEEDINGS OF THE 2009 INTERNATIONAL CONFERENCE ON MECHANICAL AND ELECTRONICS ENGINEERING, 2010, : 285 - 289
[47] A high accuracy triangle-wave signal generator for on-chip ADC testing
Bernard, S
Azaïs, F
Bertrand, Y
Renovell, M
ETW'02: 7TH IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS, 2002, : 89 - 94
[48] Built-In Self-Test for Static ADC Testing with a Triangle-Wave
Kim, Incheol
Lee, Ingeol
Kang, Sungho
IEICE TRANSACTIONS ON ELECTRONICS, 2013, E96C (02): : 292 - 294
[49] MEASURE SINE WAVE IMBALANCE
MARCHEGAY, P
ELECTRONIC DESIGN, 1992, 40 (11) : 61 - 61
[50] Some new exact traveling wave solutions of double-sine-Gordon equation
Zheng Qiang
Ren Zhong-Zhou
COMMUNICATIONS IN THEORETICAL PHYSICS, 2008, 49 (02) : 303 - 304

← 1 2 3 4 5 →