Some thoughts on sine wave ADC testing

被引：2
|
作者：
Sugawara, H [1 ]
Kobayashi, H [1 ]
Arpaia, P [1 ]
机构：
[1] Gunma Univ, Dept Elect Engn, Kiryu, Gumma 3768515, Japan
来源：
IMTC/2000: PROCEEDINGS OF THE 17TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE: SMART CONNECTIVITY: INTEGRATING MEASUREMENT AND CONTROL | 2000年
关键词：
ADC; ADC testing; sine wave testing; sampling theorem; slew rate; phase-plane;
D O I：
10.1109/IMTC.2000.846840
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper proposes state-transition plane and error plane methods to identify the ADC error type (such as additive noise, multiplicative noise, jitter and harmonics) in the sine wave ADC testing, and the theoretical analysis and simulation results demonstrate their effectiveness. Also an ADC output waveform reconstruction algorithm which is applicable for an incoherent sampling ADC testing is proposed. These results would be useful for developing new error correction algorithms and analyzing the sine wave ADC testing theoretically as well as identifying ADC error sources.
引用
收藏
页码：125 / 130
页数：6
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