Effects of dopant, temperature, and strain rate on the mechanical properties of micrometer gold-bonding wire

被引:31
|
作者
Liu, DS [1 ]
Chao, YC [1 ]
机构
[1] Natl Chung Cheng Univ, Dept Mech Engn, Chiayi 621, Taiwan
关键词
gold wire; microforce tensile test; dopant; constitutive model;
D O I
10.1007/s11664-003-0187-y
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An experimental study on the thermomechanical properties of microelectronic gold-bonding wires was conducted using high-precision, microforce tensile tests. The load-displacement behavior of three types of gold wire (GL-2 type, FA type, and SR type) was carefully recorded for determining the elastic modulus and stress-strain curves. Tests were conducted with miniature specimens at temperatures ranging from room temperature to 250degreesC and load rates on the order of 1 mm/min and 10 mm/min. The testing results indicated that the tensile strength of all three types of wire decreased with temperature, especially the SR type. The load strain rate has a significant effect on the SR type but little effect on the GL-2 and FA wires. The stress-strain curves from these tests were analyzed to fit into empirical constitutive models that account for, the strain, temperature, and strain-rate. effects.
引用
收藏
页码:159 / 165
页数:7
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